Purification and coatings
Semiconductor and PV industry: high-tech constraints
Purity constraints:
- Our purity processes allow us to achieve extremely low impurity levels, to below 5 ppm.
- The ETV-ICP method is used to detect and monitor impurities to levels below 5 ppb.
Cleanliness constraints:
- Vitreous Carbon Impregnation (VCI) was developed to reduce particle emissions and the vacuum outgassing of materials, particularly for semi-conductor applications.
Resistance to reagents used in plasma processes:
- Mersen products can be coated with a thin layer of pyrolitic carbon thereby reducing the material's permeability to reactive products to a minimum, particularly for semi-conductor applications.
- In order to further enhance the resistance to process reagents, Mersen proposes core impregnation with resin to reduce porosities.
Resistance to hydrogen above 900 °C, MOCVD reagents, and strong acids (HCl, HF)
- Mersen has mastered the deposition of silicon carbide thin films which provides unequalled protection of graphite equipment in particularly harsh environments.
Contact India
Bangalore Sales Office
Anekal Taluk
560 099 Bangalore, Karnataka
+91 80 68455264
Bangalore Sales Office
Anekal Taluk
560 099 Bangalore, Karnataka
+91 7030625005
Bangalore Sales Office
Anekal Taluk
560 099 Bangalore, Karnataka
sales.gs.india@mersen.com
+91 9900176156
+9180 68455264
Bangalore Sales Office
Bommasandra, Bangalore - 560099
+91 8197420270
Mumbai Sales Office
+91 777 001 0366
South 2
+91 968 671 6644
Contact India
Bangalore Sales Office
Anekal Taluk
560 099 Bangalore, Karnataka
+91 80 68455264
Bangalore Sales Office
Anekal Taluk
560 099 Bangalore, Karnataka
+91 7030625005
Bangalore Sales Office
Anekal Taluk
560 099 Bangalore, Karnataka
sales.gs.india@mersen.com
+91 9900176156
+9180 68455264
Bangalore Sales Office
Bommasandra, Bangalore - 560099
+91 8197420270
Mumbai Sales Office
+91 777 001 0366
South 2
+91 968 671 6644
Product Literature
ETV-ICP OES - detecting limits for high purity carbon and graphite
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ETV-ICP OES - detecting limits for high purity carbon and graphiteETV-ICP OES - detecting limits for high purity carbon and graphite
Download1.82 MB
ETV-ICP OES - detecting limits for high purity carbon and graphite